The σ T and d σ/ d T T curves of the amorphous alloy

which represent the relationship between apparent mass loss and temperature

are investigated by MTGA technique. It is found that the crystallization processes of the samples can be divided into five stages. The studies of samples annealed at the temperatures of 753￣883 K for 1 h show that

when the annealing temperature ( T a) is less than 833 K

the quantity of nanocrystalline α FeSi phase increases evidently with T a

and that the Curie temperature ( T C) of residual amorphous phase also increases linearly with T a

i.e. T C=0 52 T a+364 8

with correlation coefficient r =0 98. The variation of volume fraction of α FeSi nanocrystalline phase or residual amoprhous phase with T a is measured by MTGA technique