A micro computer controlled high temporal resolution automatic measurement system used in ultrafast phenomena is reported. The temporal resolution is better than 1 fs (the optical path resolution is 0. 084 μm)

and the relative detection sensitivity is 10-6. It has high stability and repeat ability

applied in the measurements of ultrashort pulses. The applications of this system in the measurements of femtosecond pulses and in the ultrafast dynamics of semiconductors are also discribed.