The Analysis of Fullerens Thin Film by Laser Mass Spectrometry

Zhong Feng; Zhao Shankai P; eng Shaoqi; Liu Yong

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The Analysis of Fullerens Thin Film by Laser Mass Spectrometry

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- The Analysis of Fullerens Thin Film by Laser Mass Spectrometry
- Acta Scientiarum Naturalium Universitatis SunYatseni Vol. 35, Issue S2, Pages: 180-182(1996)
- 作者机构：
  
  1. 中山大学测试中心
  2. 中山大学物理学系
- 作者简介：
- 基金信息：
- DOI：
  CLC：
- Published：1996，
  
  Published Online：25 December 1996，
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Zhong Feng, Zhao Shankai P, eng Shaoqi, et al. The Analysis of Fullerens Thin Film by Laser Mass Spectrometry. [J]. Acta Scientiarum Naturalium Universitatis SunYatseni 35(S2):180-182(1996)
DOI：

Zhong Feng, Zhao Shankai P, eng Shaoqi, et al. The Analysis of Fullerens Thin Film by Laser Mass Spectrometry. [J]. Acta Scientiarum Naturalium Universitatis SunYatseni 35(S2):180-182(1996) DOI：

摘要

在激光微探针飞行时间质谱仪上，选用合适的激光波长（２６６ｎｍ）对不同蒸发温度下得到的不同厚度的富勒苯薄膜进行直接分析测定，结果表明激光微探针质谱法具有极高灵敏度，分析速度快，几乎不损耗样品，操作简便等优点，适于进行富勒苯固体材料薄膜，甚至小１０ｎｍ厚度薄膜的分析测定

Abstract

Fullerense thin film with different thickness obtained at various evaporating temperature have been analyzed directly by a laboratory-built laser mass spectrometer

with laser wavelength of 266 nm. The results are satisfied. It demonstrated that

owing to the very high sensitivity

rapidity

simplicity and almost undestructiveness

laser mass spectrometry is suitable for the analysis of fullerenes thin film

even down to the thickness of 10 nm

关键词

激光质谱法富勒苯固体薄膜

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